The paper entitled “Which process metrics can significantly improve defect prediction models? An empirical study” by Lech Madeyski and Marian Jureczko is now available from the publisher – Springer (DOI: 10.1007/s11219-014-9241-7).
The paper entitled “Which process metrics can significantly improve defect prediction models? An empirical study” by Lech Madeyski and Marian Jureczko is now available from the publisher – Springer (DOI: 10.1007/s11219-014-9241-7).